By Topic

On the contribution of transfer admittance to external field coupling into shielded cables

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Helmers, S. ; Tech. Univ. Dresden, Germany ; Gonschorek, K.H.

The relevance of the transfer admittance in the coupling process of external electromagnetic fields into shielded cables is discussed. Methods for including the transfer impedance into EMC analysis are well-developed. But, there is still uncertainty, under which circumstances the transfer admittance becomes the more important characteristic cable parameter, that eventually determines the induced voltages and currents within the cable. Starting from the underlying concept of this study, analytical expressions for the induced voltages at the internal loads of the cable are derived. Finally, the contribution of both coupling parameters, the transfer admittance and the transfer impedance, is evaluated in an example

Published in:

Electromagnetic Compatibility, 1999 IEEE International Symposium on  (Volume:1 )

Date of Conference:

1999