Referenced Items are not available for this document.
A special class of two-pattern tests for single faults is defined using the Boolean difference approach to enhance the multiple fault detection ability for combinational circuits. It is shown that just a slight modification of the concurrent test generation method proposed by Agrawal et al. (1989) can derive such two-pattern tests.
Published in:
Electronics Letters
(Volume:27
,
Issue:
15
)
Date of Publication: 18 July 1991
- Page(s):
- 1329 - 1330
- ISSN :
- 0013-5194
- INSPEC Accession Number:
- 3979616
- Digital Object Identifier :
- 10.1049/el:19910836
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 August 2002
- Issue Date :
- 18 July 1991
- Sponsored by :
- Institution of Engineering and Technology
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