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Use of application specific integrated circuits in developing downsized instrumentation

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2 Author(s)
Burnitis, R.J. ; Giordano Associates Inc., Bradenton, FL, USA ; Koelling, R.J.

Application-specific integrated circuits (ASICs) have been used to dramatically reduce the size, weight, and power consumption of instrumentation. The authors present methods used in implementing ASICs for analog and digital built-in tests. Techniques to reduce or eliminate switching requirements and to supply clocking and synchronization functions for downsized test applications are shown. Packaging considerations and pitfalls for built-in-test ASICs are discussed. Accuracy, speed, size, and power consumption characteristics that have been achieved to date and future planned developments are provided

Published in:

AUTOTESTCON '89. IEEE Automatic Testing Conference. The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.

Date of Conference:

25-28 Sep 1989

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