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Genetic algorithm based test generation for sequential circuits

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1 Author(s)
Li Shen ; Inst. of Comput. Technol., Acad. Sinica, Beijing, China

This paper deals with simulation and genetic algorithm (GA) based test generation for sequential circuits. We proposed a new sequential depth measure called sequential element reachability, which may be used as one of the parameters of the GA. For fitness functions, we propose a new dynamic testability measure, which can be evaluated in parallel for multiple individuals. The test generation is divided to three sub-problems: initialization, test vector generation for a group of faults and test sequence generation for a target fault. Using ISCAS89 benchmarks, experimental results for the GA are given

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Test Symposium, 1999. (ATS '99) Proceedings. Eighth Asian

Date of Conference: