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An efficient interconnect test using BIST module in a boundary-scan environment

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3 Author(s)
Hyun Jin Kim ; Dept. of Electr. Eng., Yonsei Univ., Seoul, South Korea ; Jongchul Shin ; Sungho Kang

In this paper, an efficient built-in self-test (BIST) method for applying tests is developed without collisions of the test data in three-state nets in a system. A new interconnect test algorithm in multiple boundary scan chains and a BIST module based on the new BIST method are presented. The new algorithm can be easily applied to any net configurations with high flexibility

Published in:

Computer Design, 1999. (ICCD '99) International Conference on

Date of Conference:

1999