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Test and reliability: partners in IC manufacturing. 2

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4 Author(s)
Hawkins, C.F. ; New Mexico Univ., Albuquerque, NM, USA ; Segura, J. ; Soden, J. ; Dellin, T.

This article discusses the major gate oxide failure modes, reliability modeling, burn-in, and qualification testing. We present a typical method to calculate failure rates

Published in:

Design & Test of Computers, IEEE  (Volume:16 ,  Issue: 4 )