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On the integration of design and test for chips embedding MEMS

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2 Author(s)
Mir, S. ; TIMA Lab., France ; Charlot, B.

This article illustrates how fault-based, defect-oriented test approaches can be applied to the problem of testing the next generation of chips embedding MEMS

Published in:

Design & Test of Computers, IEEE  (Volume:16 ,  Issue: 4 )