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Hierarchical design and test of integrated microsystems

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3 Author(s)
T. Mukherjee ; Carnegie Mellon Univ., Pittsburgh, PA, USA ; G. K. Fedder ; R. D. Blanton

This article presents emerging results of an integrated mixed-domain design methodology similar to the mixed-signal design methodologies in the VLSI community. This methodology is based on a hierarchical mixed-domain design representation and includes a Spice-like nodal simulation environment, an “on-the-fly” component layout-synthesis module, a layout extractor for design verification, and a fault model generator for test methodology development

Published in:

IEEE Design & Test of Computers  (Volume:16 ,  Issue: 4 )