By Topic

Coherent scattering for efficient near field microscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Averbukh, I.S. ; Dept. of Chem. Phys., Weizmann Inst. of Sci., Rehovot, Israel ; Chernobrod, B.M. ; Prior, Y.

Summary form only given. A large class of near-field optical microscopes employ tapered Al coated single mode optical fibers which form a subwavelength aperture at their ends. Better spatial resolution had been achieved at IBM by an apertureless scheme in which a sharp nanosize probe of an AFM device was externally illuminated and the amplitude of the scattered light was interferometrically measured in the far-field zone.

Published in:

Quantum Electronics and Laser Science Conference, 1999. QELS '99. Technical Digest. Summaries of Papers Presented at the

Date of Conference:

23-28 May 1992