Scheduled System Maintenance:
Some services will be unavailable Sunday, March 29th through Monday, March 30th. We apologize for the inconvenience.
By Topic

A practical guide to object-oriented metrics

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Schroeder, M. ; folioTrade, USA

While there are many ways you can capture your development experiences, metrics can help quantify previous work in a way that can directly guide future efforts. For example, projects of different sizes can require vastly different levels of effort, organizational structure, and management discipline. If you let experience be your guide and understand how a newly proposed system compares to projects you've already completed, you have a much better chance of finishing on time and under budget. A wide range of metrics can aid you in managing projects, but here the author focuses on a particular set of product metrics that highlight and quantify a system's object-oriented (OO) properties. He draws many of the results mentioned here from an analysis of 18 production-level applications built in PowerBuilder-a common GUI tool used for developing client-server database applications on a variety of platforms. (The PowerBuilder metrics analyzer is available free from American Management Systems-http:// www.amsinc.com.) Although these results are derived mainly from PowerBuilder applications, they should still provide practical guidance for development in most OO languages

Published in:

IT Professional  (Volume:1 ,  Issue: 6 )