Cart (Loading....) | Create Account
Close category search window
 

Angle and time of arrival statistics for circular and elliptical scattering models

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Ertel, R.B. ; Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech. & State Univ., Blacksburg, VA, USA ; Reed, J.H.

With the introduction of antenna array systems into wireless communication networks comes the need to better understand the spatial characteristics of the channel. Scattering models provide both angle of arrival (AOA) and time of arrival (TOA) statistics of the channel. A number of different scattering models have been proposed in the literature including elliptical and circular models. These models assume that scatterers lie within an elliptical and circular region in space, respectively. In this paper, the joint TOA/AOA, the marginal TOA, and the marginal AOA probability density functions (PDFs) are derived for the elliptical and circular scattering models. These PDFs provide insight into the properties of the spatial wireless channel

Published in:

Selected Areas in Communications, IEEE Journal on  (Volume:17 ,  Issue: 11 )

Date of Publication:

Nov 1999

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.