Using STIL to describe embedded core test requirements

STIL was developed primarily to facilitate the exchange of test patterns from the source of the patterns to automatic test equipment (ATE) that will apply the patterns to the circuit. It seems a natural extension to allow preexisting tests for an embedded core to be provided in STIL format. Additional information is considered essential to allow the re-use of such test patterns. The IEEE P1500 Core Test Language task force has chosen to extend STIL so that a description of an embedded core's test requirements can be supplied in STIL syntax-possibly along with the actual test patterns for the embedded core.