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Flexible ATE module with reconfigurable circuit and its application [to CMOS imager test]

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1 Author(s)
Kitagaki, T. ; Silicon-Syst. Test Div., Hewlett-Packard Japan Ltd., Tokyo, Japan

Digital output signal of a mixed signal device contains analog information which requires post data processing to evaluate a device after acquiring data from it. This data processing typically has been done in a tester controller which is a workstation or PC, but slower bandwidth between data capture module and tester controller degrades test throughput. This data transfer time can be reduced only by custom test module that has capability of localized post data processing. In this paper, reconfigurable test module is presented. It can be configured as a dedicated test apparatus for various DUTs in a short design period. We have configured this module for CMOS imager test and it results in a reduction of four in test time

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Test Conference, 1999. Proceedings. International

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