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SymSim: symbolic fault simulation of data-flow data-path designs at the Register-Transfer level

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2 Author(s)
Yadavalli, S. ; Test Technol., Intel Corp., Santa Clara, CA, USA ; Reddy, S.M.

This paper presents a technique and tool (SymSim) for symbolic fault-simulation of data-paths specified at the Register-Transfer Level (RTL) constrained by specific control sequences. SymSim achieves this using a symbolic value system suitable for RTL simulation. It also computes and maintains input dependency information at each node in the design using a novel artifact called Dependency Set which at any time-frame contains all primary input symbols that effect the current value on that node. Symbolic fault-simulation can be used along with a symbolic test-generator to detect multiple faults with a single test to reduce test length and and generation time

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Test Conference, 1999. Proceedings. International

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