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Measurement of semiconductor laser gain and dispersion curves utilizing Fourier transforms of the emission spectra

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2 Author(s)
Hofstetter, Daniel ; Inst. de Phys., Neuchatel Univ., Switzerland ; Faist, Jerome

A new technique for the measurement of semiconductor laser gain and dispersion spectra is presented. The technique is based on an analysis of the subthreshold emission spectrum by Fourier transforms. Applications of this method to AlGaInP-based interband laser diodes and mid-infrared intersubband quantum cascade lasers are discussed. A good agreement between the measured dispersion of the refractive index and tabulated values in the literature was found.

Published in:

Photonics Technology Letters, IEEE  (Volume:11 ,  Issue: 11 )