By Topic

Measurements and source estimations of extremely low frequency brain magnetic fields in a short-term memory task by a whole-head neurogradiometer

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Nakagawa, S. ; Dept. of Biomed. Eng., Tokyo Univ., Japan ; Ueno, S. ; Imada, T.

To investigate the characteristics of visual short-term memory in humans, brain magnetic fields evoked during a delayed paired comparison task were recorded using a whole-head neuromagnetometer. The visual stimulus consisted of a circle with different colors in each quadrant. In the memory condition, subjects reacted with the index finger, when the first stimulus (Sample) was identical in color configuration to the second stimulus (Test), and with the middle finger when they differed. For the control condition, the subjects ignored the Sample, and moved the index or middle finger alternately in response to the Test. Extremely low frequency components of brain magnetic fields were observed 500 ms after the Sample onset in the temporal and/or the occipital region in the memory condition, but not in the control condition. Sources for the low frequency components were localized in the inferior part of the occipital lobe, in the vicinity of the supramarginal gyrus and the angular gyrus, and the inferior frontal gyrus. The results suggest that the activities in the inferior part of the occipital lobe controls the storage process of short-term visual memory

Published in:

Magnetics, IEEE Transactions on  (Volume:35 ,  Issue: 5 )