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Easy axis orientation mapping and application to the development of MR films

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3 Author(s)
Imagawa, Takao ; Data Storage & Retrieval Syst. Div., Hitachi Ltd., Kanagawa, Japan ; Tajima, Y. ; Mitsuoka, Katsuya

Easy axis orientation (EAO) measurement should be convenient way to characterize magnetic films for MR heads. However, the practical application was limited because of the complexity of EAO measurements. Here we clarify the EAO measurement condition by calculation and experiments. Then we show an example of EAO application to the development of MR films and identify an important parameter for wafer production

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Magnetics, IEEE Transactions on  (Volume:35 ,  Issue: 5 )