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In-situ investigation of patterned magnetic domain structures using magnetic force microscope

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4 Author(s)
Wu, Te-Ho ; Dept. of Phys., Nat. Changhua Univ. of Educ., Taiwan ; Huang, H.W. ; Huang, Y.W. ; Te-Ho Wu

A novel method for in-situ investigation of patterned magnetic domain structures is presented. Micron-length scales of permalloy thin film fabricated by a lift-off process using electron beam lithography were placed on the top and adjacent to an aluminum strip. A magnetic force microscope was used to take continuous images of the patterned permalloy films while an electrical current was applied in the aluminum strip, with which a magnetic field was established through the patterned permalloy films in the perpendicular and plane direction. As a result, changes of the magnetic domain structures were observed in the presence of the applied magnetic field

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Magnetics, IEEE Transactions on  (Volume:35 ,  Issue: 5 )