Cart (Loading....) | Create Account
Close category search window
 

Cost and benefit considerations for implementing an open systems approach to integrated diagnostics

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Freschi, S. ; AverStar Inc., Vienna, VA, USA

The Department of Defense recently completed a study that recommended an information-based approach to implementing an open architecture for integrating diagnostic functions as a critical and enabling step towards achieving the Department's strategic goals of reducing total ownership cost, shortening cycle time for technology insertion and increasing interoperability of fielded systems. There are, however, a number of challenges to successfully implementing an integrated diagnostic process on a weapon systems program to realize these benefits. The underlying source of these challenges is often the less than formal way for test and diagnostics engineers to participate in the systems engineering process and thereby compete for investment resources. To effectively participate in the trade-off studies associated with this process, a clear association must be made between the investment required for a particular integrated diagnostic functionality and the benefits that would be derived. This paper will explore a generic framework for addressing such cost and benefit considerations. To accomplish this, an open, information-based architecture for integrated diagnostics will be defined along with how it would be applied throughout a product life-cycle and the linkage of these capabilities with generic life cycle cost elements. Commercial and government systems will be used to validate these assertions

Published in:

AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE

Date of Conference:

1999

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.