Cart (Loading....) | Create Account
Close category search window
 

Consistency and stability of active contours with Euclidean and non-Euclidean arc lengths

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Tianyun Ma ; Dept. of Comput. Sci., Yale Univ., New Haven, CT, USA ; Tagare, H.D.

External energies of active contours are often formulated as Euclidean arc length integrals. In this paper, we show that such formulations are biased. By this we mean that the minimum of the external energy does not occur at an image edge. In addition, we also show that for certain forms of external energy the active contour is unstable when initialized at the true edge, the contour drifts away and becomes jagged. Both of these phenomena are due to the use of Euclidean arc length integrals. We propose a non-Euclidean arc length which eliminates these problems. This requires a reformulation of active contours where a single external energy function is replaced by a sequence of energy functions and the contour evolves as an integral curve of the gradient of these energies. The resulting active contour not only has unbiased external energy, but is also more controllable. Experimental evidence is provided in support of the theoretical claims. MRI is used as an example

Published in:

Image Processing, IEEE Transactions on  (Volume:8 ,  Issue: 11 )

Date of Publication:

Nov 1999

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.