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Test research in Japan

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6 Author(s)
Fujiwara, H. ; Dept. of Electron. & Commun., Meiji Univ., Japan ; Takamatsu, Y. ; Nanya, T. ; Yamada, T.
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Surveys recent research activities in test technology for computers, focusing on the results of university researchers. They cover test-pattern generation, fault simulation, design for testability, built-in self-test, and self-checking.<>

Published in:

Design & Test of Computers, IEEE  (Volume:5 ,  Issue: 5 )