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Yield methodology-three phases approach

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2 Author(s)
Pouedras, T. ; Cypress Semicond., San Jose, CA, USA ; Mira Ben-Tzur

A novel yield methodology approach is developed. This methodology is applicable to each of the three phases from technology development to manufacturing. This methodology highlights the goals for each phase and describes all the procedures needed for optimizing the learning rate and reducing the cycle time between technology development and manufacturing

Published in:

Advanced Semiconductor Manufacturing Conference and Workshop, 1999 IEEE/SEMI

Date of Conference:

1999