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Using SPC and template monitoring method for fault detection and prediction in discrete event manufacturing systems

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2 Author(s)
Fadel, H.K. ; Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA ; Holloway, L.E.

The behavior of manufacturing systems with discrete I/O signals can be characterized by the timing and sequencing of changes (events) in these I/O. In this paper, we present a method to monitor these signals to alarm when faulty sequencing or timing behavior occurs, and also to warn when the timing starts to deviate from its normal behavior. This is accomplished by using a combination of the time template monitoring technique and statistical process control (SPC)

Published in:

Intelligent Control/Intelligent Systems and Semiotics, 1999. Proceedings of the 1999 IEEE International Symposium on

Date of Conference:

1999