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Algorithms for automatic test-pattern generation

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2 Author(s)
Kirkland, T. ; MCC, Austin, TX, USA ; Mercer, M.R.

Three well-known algorithms for the automatic test pattern generation (ATPG) for digital circuits are the D algorithm, Podem, and Fan. The author introduces the concept of test generation and analyzes the way each algorithm uses search and backtracking techniques to sensitize a fault and propagate it to an observable point. The heuristics used to guide ATPG search and the notation used to represent circuit values are examined.<>

Published in:

Design & Test of Computers, IEEE  (Volume:5 ,  Issue: 3 )