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The invariance of node-voltage sensitivity sequence and its application in a unified fault detection dictionary method

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2 Author(s)
Feng Li ; Dept. of Electron. Eng., Fudan Univ., Shanghai, China ; Peng-Yung Woo

This paper proposes and proves an important theorem and its corollary for linear analog circuits, i.e., the invariance of the node-voltage sensitivity sequence and the invariance of the node-voltage change sequence. Based on them, a unified fault detection dictionary method for both hard and soft faults in analog circuits is proposed. This method uses only one fault characteristic code to detect any hard or soft fault of any component. In addition, the size of the dictionary is only one half of that of the original hard fault dictionary

Published in:

Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on  (Volume:46 ,  Issue: 10 )

Date of Publication:

Oct 1999

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