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Chirp based method for ADC testing: simulation and evaluation

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3 Author(s)
J. Holub ; Czech Tech. Univ., Prague, Czech Republic ; R. Smid ; J. Vedral

A time saving method for ADC testing is investigated. Common testing methods are mentioned with regard to the accuracy as well as the necessary time for the complete test. A new chirp-based method for fast evaluation of the dependence of an effective number of bits on frequency of input signal is described and the comparison between the method and standard methods is given. The suitable area of application-an “each-piece” factory testing (because of extremely short testing time)-is suggested

Published in:

Advanced A/D and D/A Conversion Techniques and Their Applications, 1999. Third International Conference on (Conf. Publ. No. 466)

Date of Conference:

1999