Close category search window
 

Improving detection of clustered microcalcifications using morphological connected operators

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Mossi, J.M. ; Univ. Politecnica de Valencia, Spain ; Albiol, A.

Breast cancer is one of the major causes of death among all cancers for middle-aged and older women, mainly in developed countries, and its incidence is rising. Since the origin of this disease is not yet known, early detection is the best way to reduce the breast cancer mortality. Today, early detection is achieved by means of mammography. Radiologists look for certain signs and characteristics indicative of cancer when evaluating a mammogram. Among these signs is the presence of clustered microcalcifications. A microcalcification is a tiny calcium deposit that has accumulated in tissue in the breast, and it appears as a small bright spot on the mammogram. Due to the large amount of mammograms a radiologist must examine, there are many people developing computer-based systems to aid in the detection of the disease. This paper presents a method to improve automatic detection of clusters of microcalcifications in mammograms

Published in:
Image Processing and Its Applications, 1999. Seventh International Conference on (Conf. Publ. No. 465)  (Volume:2 )

Date of Conference: 1999

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.