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A counting pixel chip and sensor system for X-ray imaging

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6 Author(s)
Fischer, P. ; Phys. Inst., Bonn Univ., Germany ; Hausmann, J. ; Helmich, A. ; Lindner, M.
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Results obtained with a (photon) counting pixel imaging chip connected to a silicon pixel sensor using the bump and flip-chip technology are presented. The performance of the chip electronics is characterized by an average equivalent noise charge (ENC) below 135 e and a threshold spread of less than 35 e after individual threshold adjust, both measured with a sensor attached. First results on the imaging performance are also reported

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Nuclear Science, IEEE Transactions on  (Volume:46 ,  Issue: 4 )