Cart (Loading....) | Create Account
Close category search window
 

Tunneling-stabilized magnetic force microscopy of bit tracks on a hard disk

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Rice, Paul ; Nat. Inst. of Stand. & Technol., Boulder, CO, USA ; Moreland, J.

A scanning tunneling microscope (STM) for surface magnetic force measurements on thin-film longitudinal magnetic storage media is described. The usual rigid PtIr tip of the STM was replaced by a flexible Fe-film tip and the tip position was stabilized near the surface of the sample using the STM feedback system as tunneling occurs between the tip and sample surface. Images of a CoCrTa thin-film hard disk showing 5 μm×3 μm bit tracks written by the ferrite head of a computer disk drive are presented. The images shown are comparable to images of the bit tracks on textured surfaces using either ferrofluid decoration or other magnetic force microscopy (MFM) imaging techniques. The sensitivity of the Fe-film tip was such that the influence on the image due to magnetic forces was larger than the influence due to sample surface topography

Published in:

Magnetics, IEEE Transactions on  (Volume:27 ,  Issue: 3 )

Date of Publication:

May 1991

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.