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Average depths of electron penetration. II. Angular dependence and use to evaluate secondary-electron yield by photons

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4 Author(s)
Lazurik, V. ; Lab. of Radiat. Phys., Kharkov State Univ., Ukraine ; Moskvin, V. ; Rogov, Y. ; Tabata, T.

In our previous paper [V. Lazurik, V. Moskvin and T. Tabata, IEEE Trans. Nucl. Sci. 45, pp. 626-31 (1998)] the average depth of electron penetration, Rav, has been introduced as the average of the maximum depths on the trajectories of electrons passing through a target. In the present work the dependence of Rav on the angle of incidence of an electron beam has been studied. A semi-empirical equation is derived to calculate Rav as a function of angle of incidence. We extend the study of Rav from using it to characterize the average behavior of electron beams in a target to describing the generation of secondary electrons by photon beams. It is shown that Rav can be used in a wide variety of applications in which the characteristic size of the spatial region of electron production is important

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Nuclear Science, IEEE Transactions on  (Volume:46 ,  Issue: 4 )