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Interconnection analysis for standard cell layouts

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2 Author(s)
Pedram, M. ; Dept. of Electr. Eng. Syst., Univ. of Southern California, Los Angeles, CA, USA ; Preas, B.T.

We present an accurate model and procedures for predicting the common physical design characteristics of standard cell layouts (i.e., the interconnection length and the chip area). The predicted results are obtained from analysis of the net list only, that is, no prior knowledge of the functionality of the design is used. Random and optimized placements, global routing, and detailed routing are each abstracted by procedural models that capture the important features of these processes, and closed-form expressions that define these procedural models are presented. We have verified both the global characteristics (total interconnection length and layout area) and the detailed characteristics (wire length and feedthrough distributions) of the model. On the designs in our test suite, the estimates are very close to the actual layouts

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:18 ,  Issue: 10 )