By Topic

A two-dimensional region growing least squares phase unwrapping algorithm for interferometric SAR processing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Fornaro, G. ; Ist. di Ricerche per l''Elettromagnetismo e i Componenti Elettronici, CNR, Napoli, Italy ; Sansosti, E.

This paper presents a new two-dimensional (2-D) phase unwrapping (PhU) algorithm based on a least squares (LS) region growing strategy: the wrapped phase image is partitioned in different regions that are sequentially unwrapped via a LS algorithm. Reliable regions are dealt with at the beginning of the procedure, while critical areas are unwrapped in the final steps, thus avoiding error propagation from critical to reliable areas. A conditioned least squares formulation of the phase unwrapping problem is the core of the proposed procedure: this allows the solution to be tied to “some” known boundary phase values, thus guaranteeing the correct joining of the reconstructed phase in between the different regions and preventing them from being independently unwrapped. The application of the finite element method allows a straightforward implementation of the algorithm in the discrete domain case. Experimental results, carried out on simulated and real interferometric SAR data, show the effectiveness of the proposed algorithm and the improved performances with respect to existing unwrapping procedures

Published in:

Geoscience and Remote Sensing, IEEE Transactions on  (Volume:37 ,  Issue: 5 )