By Topic

Effect of internal reflections on the radiation properties and input admittance of integrated lens antennas

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
van der Vorst, M.J.M. ; Fac. of Electr. Eng., Eindhoven Univ. of Technol., Netherlands ; de Maagt, P.J.L. ; Herben, M.H.A.J.

This paper begins with the modeling of the reflected waves within integrated lens antennas, which consist of a dielectric lens on which a planar antenna is mounted. It is demonstrated that if the relative dielectric constant of the lens is small (εr⩽4), the single- and double-reflected waves are sufficient to analyze the effect of the internal reflections. For small angles around boresight, these unwanted reflected fields mainly affect the cross-polar far-field pattern, while for large observation angles, both the co-polar and cross-polar patterns are significantly disturbed. It appears that by neglecting the internally reflected field contributions, the beam efficiency may be overestimated more than 10%. In this paper, two types of matching layers are analyzed in order to reduce these unwanted reflections. It is demonstrated that the radiation performances of the integrated lens antennas with optimum-thickness and quarter-wavelength matching layer are almost equal. Even for low dielectric-constant lenses, the beam efficiency can be increased by over 10%. Finally, it is demonstrated that the internal reflections may also have a strong effect on the antenna admittance, which can only be reduced partly by the use of a matching layer

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:47 ,  Issue: 9 )