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Stress analysis method considering piezoelectric effects and its application to static strain optic devices

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3 Author(s)
Saitoh, K. ; Dept. of Electron. & Inf. Eng., Hokkaido Univ., Sapporo, Japan ; Koshiba, M. ; Tsuji, Y.

A stress analysis method considering piezoelectric effects based on the finite-element method (FEM), which can be applied to arbitrarily anisotropic material-based optical waveguide devices, is newly formulated. To produce a two-step analysis of static strain optic (SSO) and electrooptic (EO) modulations of optical waveguide devices, this stress analysis is linked to the guided mode analysis and the beam propagation analysis taking into account the refractive index changes. Numerical examples are shown for strain-induced optical waveguides and strain-induced polarization mode converters on LiNbO3 substrates

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Lightwave Technology, Journal of  (Volume:17 ,  Issue: 9 )