Variation of LaSrCuO film temperature during pulsed laser deposition on LaSrGaO substrate

By using a conventional laser ablation system, LSCO thin films were deposited on LaSrGaO/sub 4/(100) substrates in an oxygen environment. During deposition the temperature of the film surface was measured with an infrared pyrometer. The measured temperature decreases following the exponential law of radiation absorption in a material. The experimental results indicate an increase of the deviation from the exponential law with decreasing oxygen pressure in the chamber. The conclusion of this experiment reveals the fact that either the refraction index of the deposited material may vary nonuniformly or the deposition velocity is not a constant during laser ablation.