By Topic

Thermal cycling of thick-film and thin-film electrical contacts on melt-processed YBCO

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)

Results are presented from thermal cycling experiments of electrical contacts, carried out to investigate possible failure mechanisms. The contacts were of thick-film silver and thin-film gold on thick-film yttrium barium copper oxide, the latter having been previously fired onto yttria-stabilised zirconia substrates. Continuous observation was made of a dc current passing through the samples, via thin copper wires and the cycling itself was a series of thermal shocks, produced by immersion of the samples in liquid nitrogen, followed by rapid warm-up over a temperature increment of 100 K. It was found that the method of attachment of the copper wires had the greatest effect on the reliability of the deposited contacts.

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:9 ,  Issue: 2 )