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Scanning force microscope cantilever for voltage sampling with ultrafast time resolution

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2 Author(s)
Steffens, W.M. ; Inst. of Tech. Electron., Kassel Univ., Germany ; Oesterschulze, E.

A scanning force microscopy (SFM) cantilever for the investigation of ultrafast signals is presented. High temporal resolution is achieved by integrating a photoconductive switch within a coplanar waveguide structure onto a low temperature GaAs-GaAs cantilever. Experimental results and numerical calculations of the detection of picosecond guided electrical signals based on the optoelectronic technique of photoconductive sampling are presented.

Published in:

Electronics Letters  (Volume:35 ,  Issue: 13 )