Cart (Loading....) | Create Account
Close category search window

Microstructural defects in bicrystal substrates and their influence on yttrium barium copper oxide grain boundary Josephson junctions

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Hsu, J.W.P. ; Dept. of Phys., Virginia Univ., Charlottesville, VA, USA ; McDaniel, E.B. ; Campillo, A.L. ; Gausepohl, S.C.
more authors

Using a near-field scanning optical microscope (NSOM), we found non-uniformly distributed microstructural defects near the fusion boundary of bicrystal substrates. These defects depict themselves as circular dark spots in the optical transmission images. We attribute these optical features to near-surface voids at the boundary previously found in transmission electron microscopy studies. Our results show a direct link between the presence of these defects and the superconducting properties of the YBa/sub 2/Cu/sub 3/O/sub 7/ (YBCO) grain boundary Josephson junctions (GBJJs). We find that junctions that are fabricated over highly defected regions of the bicrystal substrates have lower critical temperatures and currents. The positions of defects across a junction also play a role in determine the device characteristics. Strain fields associated with these defects are most likely responsible for affecting YBCO film growth locally and junction performance. We employ an NSOM to survey these microstructural defects in bicrystals of various tilt angles and of different materials that are commonly used for fabrication of YBCO GBJJs. We find that these defects and their strain fields are the result of the bicrystal fusion process and are not intrinsic to the materials.

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:9 ,  Issue: 2 )

Date of Publication:

June 1999

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.