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Properties of SNS Josephson junctions fabricated by 200 keV oxygen implantation into YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta//

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6 Author(s)
Kahlmann, F. ; Inst. fur Schicht- und Ionentech., Forschungszentrum Julich GmbH, Germany ; Engelhardt, A. ; Schubert, J. ; Zander, W.
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The properties of SNS Josephson junctions in YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// thin films have been investigated, which were fabricated by oxygen irradiation at 200 keV through a 50 nm wide slit in an implantation mask. After annealing the irradiated microbridges at 500/spl deg/C in an oxygen atmosphere, the implanted region has a reduced but finite transition temperature, allowing Josephson coupling in a temperature window of <15 K. Close to the coupling temperature the critical current shows a nearly complete modulation in an applied magnetic field. This indicates a homogeneous current distribution in the junctions and therefore a homogeneous defect distribution throughout the implanted and subsequently annealed region of the superconducting microbridges. Over the entire temperature range of Josephson coupling, the junctions exhibit resistively shunted junction like I-V characteristics with additional excess current. Furthermore, the exponential dependence of the critical current on temperature is in good agreement with conventional superconductor-normal-superconductor proximity effect theory.

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:9 ,  Issue: 2 )

Date of Publication:

June 1999

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