By Topic

Effects of the finite HTS film thickness on the resonant frequency of the axially symmetric TE/sub 01/spl delta// mode of a parallel plate dielectric resonator

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Sang Young Lee ; Dept. of Phys., Konkuk Univ., Seoul, South Korea ; H. J. Kwon ; J. H. Suh ; J. H. Lee
more authors

An axially symmetric TE/sub 01/spl delta// mode of a parallel plate dielectric resonator is studied for investigating effects of the film thickness (t) of high-temperature superconductor (HTS) films on the mode resonant frequency (f/sub 0/). A sapphire-loaded cylindrical cavity resonator with YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// (YBCO) endplates and mode f/sub 0/ of about 19 GHz has been prepared and its unloaded Q (Q/sub 0/) and f/sub 0/ are investigated at temperatures below the critical temperature of YBCO. From theoretical analysis, it appears that f/sub 0/ changes by less than 0.4% for different t's when the ratio of t to the London penetration depth (/spl lambda/) is more than 10/sup -2/. Meanwhile, from experiments, significant dependence of f/sub 0/ on the gap distance (s) between the sapphire rod and the top endplate is observed with f/sub 0/ changing by about 1 GHz (/spl sim/5%) from 19.578 GHz to 18.648 GHz, as s increases from 0 to 1 mm at 77 K. The experimental values of f/sub 0/ are observed to agree well to the calculated f/sub 0/. Applicability for tunable high-Q resonators is described.

Published in:

IEEE Transactions on Applied Superconductivity  (Volume:9 ,  Issue: 2 )