Cart (Loading....) | Create Account
Close category search window

Force-balanced coil for large scale SMES

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Nomura, S. ; Res. Lab. for Nucl. Reactors, Tokyo Inst. of Technol., Japan ; Osaki, T. ; Kondoh, J. ; Tsutsui, H.
more authors

In large scale SMES, huge electromagnetic force caused by high magnetic fields and coil currents is a serious problem. In order to solve this problem, we propose a concept of force-balanced coil (FBC) applied to the SMES. The FBC balances the centering force with the hoop force, both of which are exerted in the major radius direction. Moreover, for the optimization of large aspect ratio superconducting coils, we propose a stress-balanced coil (SEC) concept, improving the concept of FBC, which balances magnetic pressures at the coil nose part where the produced magnetic field reaches its maximum value. Comparing the toroidal magnetic field coil (TFC) and FBC with SEC, the last can reduce coil stresses and obtain large stored energy with shorter length conductors and/or lower magnetic fields.

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:9 ,  Issue: 2 )

Date of Publication:

June 1999

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.