By Topic

Temperature stability of ultrahigh-speed GaAs JFET ICs

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Kawasaki, H. ; Sony Corp. Res. Center, Yokohama, Japan ; Wada, M. ; Hida, Y. ; Takano, C.
more authors

Ultrahigh-speed digital integrated circuits (ICs) implemented with GaAs/int JFETs are confirmed to be reliable in a wide variety of temperatures. Divide-by-256/258 dual-modulus prescaler ICs using source-coupled FET logic (SCFL) circuits that can operate up to 9 GHz have temperature coefficients of operating frequency stability and input power sensitivity of -17.2 MHz/degree and +0.12 dBm/degree between -20 and +100°C, respectively. Direct-coupled FET logic (DCFL) circuits were also confirmed to have very small temperature coefficients. The variations of the maximum operating frequency and the input power sensitivity of the DCFL divide-by-4 divider IC are -1.93 MHz/degree and +0.47 dBm/degree, respectively, between -60 and +100°C. The variation in the threshold voltage of the JFET is -0.88 mV/degree which is very small for the temperature stability of GaAs digital ICs

Published in:

Solid-State Circuits, IEEE Journal of  (Volume:26 ,  Issue: 6 )