Cart (Loading....) | Create Account
Close category search window
 

Theoretical study of a potential ultraviolet avalanching detector based on impact ionization out of confined quantum states

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Wang, Yang ; Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA ; Brennan, Kevin F. ; Ruden, P.Paul

A detailed analysis is given of a possible new ultraviolet photodetector based on impact ionization out of confined quantum states using a GaN-AlxGa1-xN multiple quantum well array. The GaN-AlGaN materials system is continuously gradable in composition and has a large conduction-band-edge discontinuity, which makes it an attractive candidate for asymmetric confined quantum state photomultipliers. The impact-excitation rate is determined for various device geometries and doping concentrations. As the carrier concentration increases in a quantum confined structure. the excitation probability increases. The ionization rate increase is due in part to the increase in the number of carriers within the high-energy subbands of the well with the resulting reduction of the carrier ionization threshold energy

Published in:

Quantum Electronics, IEEE Journal of  (Volume:27 ,  Issue: 2 )

Date of Publication:

Feb 1991

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.