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Diagnosis of scan cells in BIST environment

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2 Author(s)
Rajski, J. ; Mentor Graphics Corp., Wilsonville, OR, USA ; Tyszer, J.

The paper presents a new fault diagnosis technique for scan-based designs with BIST. It can be used for nonadaptive identification of the scan cells that are driven by erroneous signals. The proposed scheme employs a pseudorandom scan cell selection routine which, in conjunction with a conventional signature analysis and simple reasoning procedure, allows flexible trade-offs between the test application time and the diagnostic resolution

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Computers, IEEE Transactions on  (Volume:48 ,  Issue: 7 )