Referenced Items are not available for this document.
Practical considerations in the design of CMOS charge pumps are discussed. The non-ideal effects of the charge pump due to the leakage current, the mismatch, and the delay offset in the P/FD are quantitatively analyzed. To use the appropriate charge pump in various PLL applications, several architectures are investigated and their performances are compared. The improved design of both the single-ended and the differential charge pumps are presented with the simulation result
Published in:
Circuits and Systems, 1999. ISCAS '99. Proceedings of the 1999 IEEE International Symposium on
(Volume:2
)
Date of Conference: Jul 1999
- Page(s):
- 545 - 548 vol.2
- Meeting Date :
- 30 May 1999-02 Jun 1999
- Print ISBN:
- 0-7803-5471-0
- INSPEC Accession Number:
- 6396978
- Conference Location :
- Orlando, FL
- Digital Object Identifier :
- 10.1109/ISCAS.1999.780807
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