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A fast and accurate method characterizing embedded and coupled transmission lines is presented. Such multilayered structures are used to realize integrated directional couplers. The method requires simple two-ports network analyzer S-parameter measurements performed with a TRL calibration. Extractions of inductance and capacitance matrices are obtained in the [0.5-3.5] GHz frequency bandwidth. Comparisons with electromagnetic modeling results are given.
Microwave Symposium Digest, 1999 IEEE MTT-S International (Volume:4 )
Date of Conference: 13-19 June 1999