Referenced Items are not available for this document.
A fast and accurate method characterizing embedded and coupled transmission lines is presented. Such multilayered structures are used to realize integrated directional couplers. The method requires simple two-ports network analyzer S-parameter measurements performed with a TRL calibration. Extractions of inductance and capacitance matrices are obtained in the [0.5-3.5] GHz frequency bandwidth. Comparisons with electromagnetic modeling results are given.
Published in:
Microwave Symposium Digest, 1999 IEEE MTT-S International
(Volume:4
)
Date of Conference: 13-19 June 1999
- Page(s):
- 1759 - 1762 vol.4
- Meeting Date :
- 13 Jun 1999-19 Jun 1999
- Print ISBN:
- 0-7803-5135-5
- INSPEC Accession Number:
- 6346201
- Conference Location :
- Anaheim, CA, USA
- Digital Object Identifier :
- 10.1109/MWSYM.1999.780312
- Product Type:
- Conference Publications
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