By Topic

A framework for robust measurement-based admission control

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Grossglauser, Matthias ; AT&T Labs. Res., Florham Park, NJ, USA ; Tse, D.N.C.

Measurement-based admission control (MBAC) is an attractive mechanism to concurrently offer quality of service (QoS) to users, without requiring a priori traffic specification and on-line policing. However, several aspects of such a system need to be dearly understood in order to devise robust MBAC schemes, i.e., schemes that can match a given QoS target despite the inherent measurement uncertainty, and without the tuning of external system parameters. We study the impact of measurement uncertainty, flow arrival, departure dynamics, and of estimation memory on the performance of a generic MBAC system in a common analytical framework. We show that a certainty equivalence assumption, i.e., assuming that the measured parameters are the real ones, can grossly compromise the target performance of the system. We quantify the improvement in performance as a function of the length of the estimation window and an adjustment of the target QoS. We demonstrate the existence of a critical time scale over which the impact of admission decisions persists. Our results yield new insights into the performance of MBAC schemes, and represent quantitative and qualitative guidelines for the design of robust schemes

Published in:

Networking, IEEE/ACM Transactions on  (Volume:7 ,  Issue: 3 )