Cart (Loading....) | Create Account
Close category search window
 

Comparison of traffic performance predictions for three different handoff-region models

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Shun-Shim Jean ; Wireless Oper. Manage. Team, Electron. & Telecommun. Res. Inst., Taejeon, South Korea ; Cheolhye Cho

A comparison of traffic performance predictions is shown for three different handoff-region models. The first model is based on a statistical approach assuming an exponential distribution of the handoff-region dwell time. The other two models are newly proposed and based on the fact that the distribution of the dwell-time in the handoff region can be derived only using a priori cell parameters such as cell geometry, mobile velocity distribution, channel numbers and etc. In the second model, the distribution of the dwell-time in the handoff region has been derived in closed form, while the handoff region is approximated as a rectangle. In the third model, no approximation on the geometry of the handoff region has been made, while the handoff dwell-time distribution is expressed in an integral form

Published in:

Vehicular Technology Conference, 1999 IEEE 49th  (Volume:3 )

Date of Conference:

Jul 1999

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.