By Topic

Three-dimensional inspection of ball grid array using laser vision system

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Pyunghyun Kim ; Dept. of Mech. Eng., Hanyang Univ., Seoul, South Korea ; Sehun Rhee

An inspection process of the ball grid array (BGA) is proposed using a laser vision system which provides range image. This study suggests an inspection algorithm using the range images for evaluating the height of the solder ball, coplanarity and lead pitch, which are major factors in the BGA surface mounting technology. A feature-based algorithm was used in implementing region segmentation of range images. By deciding the BGA orientation using plane modeling, the errors of the range finding system were compensated and the reference of the height of the solder ball was found. Also, a method for measuring the height of the solder ball using free-form surface modeling was proposed. And, from the measured heights, the pitches and coplanarity were calculated

Published in:

Electronics Packaging Manufacturing, IEEE Transactions on  (Volume:22 ,  Issue: 2 )