By Topic

Testing microwave devices under different source impedances: a novel technique for on-line measurement of source and device reflection coefficients

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
G. L. Madonna ; Dipt. di Elettronica, Torino Univ. ; M. Pirola ; U. Pisani

This paper describes a new approach for fast and accurate determination of the source reflection coefficient in microwave source-pull measurements. To the authors' knowledge, this is the only technique that allows the simultaneous measurement of the source and the DUT gammas. A traditional vector network analyzer is used as a three-channel receiver. The calibration procedure is based on a new reflectometer model that extends the traditional error box concept. Experimental results are presented and compared to data obtained with traditional techniques

Published in:

Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE  (Volume:1 )

Date of Conference:

1999