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Testing microwave devices under different source impedances: a novel technique for on-line measurement of source and device reflection coefficients

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3 Author(s)
Madonna, G.L. ; Dipt. di Elettronica, Torino Univ. ; Pirola, M. ; Pisani, U.

This paper describes a new approach for fast and accurate determination of the source reflection coefficient in microwave source-pull measurements. To the authors' knowledge, this is the only technique that allows the simultaneous measurement of the source and the DUT gammas. A traditional vector network analyzer is used as a three-channel receiver. The calibration procedure is based on a new reflectometer model that extends the traditional error box concept. Experimental results are presented and compared to data obtained with traditional techniques

Published in:

Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE  (Volume:1 )

Date of Conference:

1999

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